Characterization of CMOS image sensors with Nyquist rate pixel-level ADC

Characterization of CMOS image sensors with Nyquist rate pixel-level ADC

著者名:

掲載資料名:

Sensors, cameras, and applications for digital photography : 27-28 January 1999, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3650

発行年:

1999

開始ページ:

52

終了ページ:

62

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431219 [0819431214]

言語:

英語

請求記号:

P63600/3650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018080
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Sensors, Cameras, and Applications for Digital Photography
回次:	1999
会議開催地:	San Jose, CA, USA
会議開催年:	1999.01.27-1999.01.28

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