Scatter rejection methods in megavoltage imaging with an amorphous-silicon flat-panel array

Scatter rejection methods in megavoltage imaging with an amorphous-silicon flat-panel array

著者名:

Groh,B.A. ( Deutsches Krebsforschungszentrum )
Spies,L.
Hesse,B.M.
Bortfeld,T.

掲載資料名:

Medical Imaging 2000: Physics of Medical Imaging

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3977

発行年:

2000

開始ページ:

601

終了ページ:

608

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435941 [0819435945]

言語:

英語

請求記号:

P63600/3977

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018053
シリーズID:	PA00000029
会議名:	Medical Imaging
回次:	2000
会議開催地:	San Diego, CA, USA
会議開催年:	2000.02.13-2000.02.15

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