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Z-contrast STEM imaging and Ab initio calculations of grain boundaries in SrTiO3

著者名:
掲載資料名:
Interfacial engineering for optimized properties II : symposium held December 1-2, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
586
発行年:
2000
開始ページ:
37
出版情報:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994942 [1558994947]
言語:
英語
請求記号:
M23500/586
資料種別:
国際会議録

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