Molecular Secondary Ion Mass Spectrometry

Molecular Secondary Ion Mass Spectrometry

著者名:

掲載資料名:

Desorption mass spectrometry : are SIMS and FAB the same?

シリーズ名:

ACS symposium series

シリーズ巻号:

291

発行年:

1985

開始ページ:

1

出版情報:

Washington, D.C.: American Chemical Society

ISSN:

00976156

ISBN:

9780841209428 [0841209421]

言語:

英語

請求記号:

A05800/291

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018014
シリーズID:	PA00000004
会議名:	Symposium on Desorption Mass Spectrometry
回次:	1984
会議開催地:	St. Paul, MN, USA
会議開催年:	1984.10.07-1984.10.10

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1 国際会議録 Molecular beam static secondary ion mass spectrometry for surface analysis A.D. Appelhans, G.S. Groenewold, J.C. Ingram, D.A. Dahl, J.E. Delmore Society of Photo-optical Instrumentation Engineers	7 国際会議録 Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry Barbosa, J., Teodoro, O.M.N.D., Moutinho, A.M.C., Ribeiro, S., Monteiro, C. Trans Tech Publications
2 国際会議録 Characterization of Gate Dielectric Layers with Secondary Ion Mass Spectrometry (SIMS) Erickson, J.W., Brock, R., Killian, A., Johnston, G., Trotter, D., Nouri, F. Electrochemical Society	8 国際会議録 Ion Implantation and Secondary Ion Mass Spectrometry of Compound Semiconductors Wilson, R G. Electrochemical Society
3 国際会議録 Static secondary ion mass spectrometry characterization of nail polish and paint surfaces Gresham,G.L., Groenewold,G.S., Bauer,W.F., Ingram,J.C., Avci,R. SPIE - The International Society for Optical Engineering	9 国際会議録 Measurements of the Diffusion of Iron and Carbon in Single-Crystal NiAl Using Ion Implantation and Secondary Ion Mass Spectrometry Hanrahan, R. J., Jr., Withrow, S. P., Puga-Lambers, M. MRS - Materials Research Society
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5 国際会議録 Secondary Ion Mass Spectrometry: A Multidimensional Technique Colton, Richard J., Kidwell, David A., Ramseyer, George O., Ross, Mark M. American Chemical Society	11 国際会議録 Plasma- and Corona-Modified Polymer Surfaces: Characterization by Static Secondary Ion Mass Spectrometry Ooij, W. J. van, Michael, R. S. American Chemical Society
6 国際会議録 Negative Secondary Ion Mass Spectrometry of Gold Surfaces Boldach G., Main E. D., Standing G. K., Westmore B. J. Plenum Press	12 国際会議録 Near-surface and interfacial profiling by neutron depth profiling (NDP) and secondary ion mass spectrometry (SIMS) Downing, R. G., Fleming, R. F., Maki, J. T., Simons, D. S., Stallard, B. R. North-Holland

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