D-IMPURITIES IN A QUASI-TWO-DIMENSIONAL SYSTEM: STATISTICS AND SCREENING
- 著者名:
Li, W. J. Wang, J. L. Cheng, J. -P. Holmes, S. Wang, Y. J. McCombe, B. D. Schaff, W. - 掲載資料名:
- Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 325
- 発行年:
- 1994
- 開始ページ:
- 79
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992245 [1558992243]
- 言語:
- 英語
- 請求記号:
- M23500/325
- 資料種別:
- 国際会議録
類似資料:
Kluwer Academic Publishers |
Plenum Press |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
Plenum Press |
Kluwer Academic Publishers |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |