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Nanoindentation Characterization of Coated Systems: P:S2-A New Approach Using the Continuous Stiffness Technique

著者名:
Page, T. F.
Pharr, G. M.
Hay, J. L.
Oliver, W. C.
Lucas, B. N.
Herbert, E.
Riester, L.
さらに 2 件
掲載資料名:
Fundamentals of nanoindentation and nanotribology : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
522
発行年:
1998
開始ページ:
53
出版情報:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994287 [1558994289]
言語:
英語
請求記号:
M23500/522
資料種別:
国際会議録

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