Particle and UV Imaging With Position Sensitive MCP Detectors - Three-Dimensional Momentum Space Imaging
- 著者名:
Mergel, V. Jagutzki, O. Spielberger, L. Ullmann-Pfleger, K. Dorner, R. Schmidt-Bocking, H. - 掲載資料名:
- In situ process diagnostics and intelligent materials processing : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 502
- 発行年:
- 1998
- 開始ページ:
- 171
- 出版情報:
- Warrendale, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994072 [1558994076]
- 言語:
- 英語
- 請求記号:
- M23500/502
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering | |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
American Chemical Society |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |