Direct Observation of Atomic Structures of Defects in GaN by High-Resolution Z-Contrast STEM
- 著者名:
Xin, Y. Pennycook, S. J. Browing, N. D. Nellist, P. D. Sivanathan, S. Beaumont, B. Faurie, J-P. Gibart, P. - 掲載資料名:
- Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 482
- 発行年:
- 1998
- 開始ページ:
- 781
- 出版情報:
- Warrendale, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993877 [1558993878]
- 言語:
- 英語
- 請求記号:
- M23500/482
- 資料種別:
- 国際会議録
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2
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*DIRECT IMAGING OF THE ATOMIC STRUCTURE AND CHEMISTRY OF DEFECTS AND INTERFACES BY Z-CONTRAST STEM
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