Effects of Nitrogen on Preventing the Crystallization of Amorphous Ta-Si-N Diffusion Barrier
- 著者名:
- 掲載資料名:
- Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 472
- 発行年:
- 1997
- 開始ページ:
- 331
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993761 [1558993762]
- 言語:
- 英語
- 請求記号:
- M23500/472
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Effects of Nitrogen on Preventing the Crystallization of Amorphous Ta-Si-N Diffusion Barrier
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Elsevier |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
5
国際会議録
Diffusion Barrier Property of Sputtered Molybdenum Nitride Films for Dram Copper Metallization
MRS - Materials Research Society |
MRS - Materials Research Society |
6
国際会議録
Crystallization Behavior and Ferroelectric Properties of YMnO3 Thin Films on Si (100) Substrates
Materials Research Society |
12
国際会議録
Intentional Back Flow Effects on Ruptured Steam Generator Cooldown During a SGTR Event for KSNP
American Society of Mechanical Engineers |