Characterization of Sio-doped GaAs using photoellipsometry and photoreflectance
- 著者名:
- Mochizuki,M. ( Tokyo Univ.of Agriculture & Technology )
- Kobayashi,K.
- Yaguchi,H.
- Saitoh,T.
- Xiong,Y.-M.
- 掲載資料名:
- International Symposium on Polarization Analysis and Applications to Device Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2873
- 発行年:
- 1996
- 開始ページ:
- 270
- 終了ページ:
- 273
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422712 [0819422711]
- 言語:
- 英語
- 請求記号:
- P63600/2873
- 資料種別:
- 国際会議録
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