Determination of microstructure-related optical constants of titanium dioxide thin films using optical methods

Determination of microstructure-related optical constants of titanium dioxide thin films using optical methods

著者名:

掲載資料名:

International Symposium on Polarization Analysis and Applications to Device Technology

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2873

発行年:

1996

開始ページ:

234

終了ページ:

237

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422712 [0819422711]

言語:

英語

請求記号:

P63600/2873

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017962
シリーズID:	PA00000029
会議名:	International Symposium on Polarization Analysis and Applications to Device Technology
回次:	1996
会議開催地:	Yokohama, Japan
会議開催年:	1996.06.12-1996.06.14

類似資料:

1 国際会議録 Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry Kim, H.J., Cho, Y.J., Cho, H.M., Chegal, W., Lee, Y.W., Kim, S.Y. SPIE - The International Society of Optical Engineering	7 国際会議録 MTF measurement of LCDs by a linear CCD imager: I. Monochrome case Kim,T.H., Choe,O.S., Lee,Y.W., Cho,H.M., Lee,I.W. SPIE-The International Society for Optical Engineering
2 国際会議録 Azimuth calibration method in ellipsometer with imaging spectrograph Chegal, W., Cho, Y.J., Kim, H.J., Cho, H.M., Lee, Y.W., Kim, S.H. SPIE - The International Society of Optical Engineering	8 国際会議録 Equipment for Real Time MTF Testing of Copier and Fax Lenses, Cho,H.M., Lee,Y.W., Chung,Y.B., Lee,I.W., Kim,T.H., Choe,O.S. SPIE-The International Society for Optical Engineering
3 国際会議録 Effects of Post-Annealing on the Electrical and Optical Properties of ZnO Thin Films Grown on Al2O3 Substrates by Atomic Layer Epitaxy C.M. Lee, Y.J. Cho, H.J. Kim, W.W. Lee, H.W. Kim, C.K. Hwangbo, J.G. Lee Trans Tech Publications	9 国際会議録 Fabrication of optical waveguides using laser direct writing method Cho, S.H., Kim, J.M., Kim, J.G., Chang, W.S., Lee, E.S. SPIE - The International Society of Optical Engineering
4 国際会議録 Use of Non-Hazardous Components as Substitutes for Traditionally Hazardous Components Cell Sensing Margin of Lead-Free (Bi.La)4Ti3O12Thin Film Deposited on MTP … Choi, J.H., Yoo, H.S., Cho, K.W., Kim, N.K., Oh, S.H., Choi, E.S., Yeom, S.J., Sun, H.J., Lee, S.S., Lee, K.N., Hong, … Trans Tech Publications	10 国際会議録 In-situ single-wavelength ellipsometer for a vacuum chamber Chegal,W., Ye,S., Cho,H.M., Lee,Y.W., Kim,S.H., Kwak,Y.K. SPIE-The International Society for Optical Engineering
5 国際会議録 Rapid bio-patterning method based on the fabrication of PEG microstructures and layer-by-layer polymeric thin film H. -W. Shim, J. -H. Lee, C. -H. Choi, H. -M. Song, B. -Y. Kim, D. -P. Kim, C. -S. Lee SPIE - The International Society of Optical Engineering	11 国際会議録 A New Technique for Measuring Radius of Curvature Using Half-Aperture Bidirectional Shearing Interferometer, Lee,Y.W., Cho,H.M., Shin,D.J., Chung,Y.B., Lee,I.W. SPIE-The International Society for Optical Engineering
6 国際会議録 Low-Temperature Chemical Vapor Deposition of Titanium Dioxide Thin Films Using Tetranitratotitanium (IV) Gilmer, D. C., Gladfelter, W. L., Colombo, D. G., Taylor, C. J., Roberts, J., Campbell, S. A., Kim, H-S., Wilk, G. D., … MRS - Materials Research Society	12 国際会議録 Determination of the Optical Constants of VO₂ and Nb-Doped VO₂ Thin Films H.M. Pinto, J. Correia, R. Binions, C. Piccirillo, I.P. Parkin Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12