Carrier Capture to Deep Levels in Semi-Insulating InP and GalnP
- 著者名:
- 掲載資料名:
- Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 297-298
- 発行年:
- 1999
- 開始ページ:
- 291
- 終了ページ:
- 294
- 出版情報:
- Zurich-Uetikon, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878498246 [0878498249]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Materials Research Society |
Trans Tech Publications |
11
国際会議録
Intrinsic Defects in Semi-Insulating SiC: Deep Levels and their Roles in Carrier Compensation
Trans Tech Publications |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |