Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon

Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon

著者名:

Deicher,M.

掲載資料名:

Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988

シリーズ名:

Materials science forum

シリーズ巻号:

38-41

発行年:

1989

巻:

Part1

開始ページ:

367

終了ページ:

372

出版情報:

Aederlmannsdorf, Switzwelns: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878495849 [0878495843]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017895
シリーズID:	PA00000012
会議名:	International Conference on Defects in Semiconduotors : ICDS
回次:	15th
会議開催地:	Budapest, Hungary
会議開催年:	1988.08.22-1988.08.26

類似資料:

1 国際会議録 STRUCTURAL DEFECTS IN ION-IMPLANTED SILICON OBSERVED BY PERTURBED ANGULAR CORRELATION. DEICHER,M., GRUBEL,G., RECKNAGEL,E., WICHERT,Th. Trans Tech Publications	7 国際会議録 Geometrical structure of lattice defect-impurity configurations determined by TDPAC Deicher, M., Echt, O., Recknagel, E., Wichert, Th. North Holland
2 国際会議録 Thermal Stability of Acceptor-Hydrogen Pairs in Silicon Deicher,M., Grtibel,G., Keller,R., Recknagel,E., Schulz,N., Skudlik,H., Wichert,Th. Trans Tech Publications	8 国際会議録 On the Pairing between Indium and Carbon Atoms in Silicon Ott,U., Wolf,H., Krings,Th., Wichert,Th., Haｦﾂlein,H., Sielemann,R., Deicher,M., Newman,R.C., Zulehner,W. Trans Tech Publications
3 国際会議録 LOCALIZATION OF HYDROGEN IN B AND In DOPED SILICON BY ION CHANNELING AND PAC Wichert, Th., Skudlik, H., Carstanjen, H. -D., Enders, T., Deicher, M., Grubel, G., Keller, R., Song, L., Stutzmann, M. Materials Research Society	9 国際会議録 PAC Studies of the Fast Diffuser 100Pd in Lead Deicher,M., Grubel,G., Kopp,G., Recknagel,E. Trans Tech Publications
4 国際会議録 *FORMATION OF In-Cu PAIRS IN SILICON DURING CHEMOMECHANICAL POLISHING Wichert, Th., Keller, R., Deicher, M., Pfeiffer, W., Skudlik, H., Steiner, D. Materials Research Society	10 国際会議録 REGROWTH OF DAMAGED LAYERS IN DIAMOND PRODUCED BY ION IMPLANTATION Sandhu, G.S., Liu, B., Parikh, N.R., Hunn, J.D., Swanson, M.L., Wichert, Th., Deicher, M., Skudlik, H., Lennard, W.N., … Materials Research Society
5 国際会議録 PASSIVATING COMPLEXES IN Cd DOPED GaAs AND InP: MICROSCOPIC PROPERTIES AND ELCTRICAL EFFECTS Moriya, N., Deicher, M., Kalish, R., Keller, R., Magerle, R., Pfeiffer, W., Pross, P., Skudlik, H., Wichert, Th., Wolf, … Materials Research Society	11 国際会議録 *CHARACTERIZATION OF DEFECT STRUCTURES BY PERTURBED ANGULAR CORRELATION TECHNIQUE Wichert, Thomas Materials Research Society
6 国際会議録 Trapping of Lattice Defects at 111In Atoms in Cold-Worked Copper Deicher,M., Grubel,G., Reiner,W., Wichert,Th. Trans Tech Publications	12 国際会議録 Defects in metals - detected by spin precession methods Wichert, Th., Recknagel, E. North Holland

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