New 3D surface profile measurement based on phase-shift interfering technology
- 著者名:
- 掲載資料名:
- Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3275
- 発行年:
- 1998
- 開始ページ:
- 15
- 終了ページ:
- 17
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427144 [0819427144]
- 言語:
- 英語
- 請求記号:
- P63600/3275
- 資料種別:
- 国際会議録
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