Development of a high-performance e-beam resist suitable for advanced mask fabrication
- 著者名:
Tamura,K. ( Toray Industries,Inc. (Japan) ) Niwa,H. ( Toray Industries,Inc. (Japan) ) Kanetsuki,S. ( Toray Industries,Inc. (Japan) ) Asani,M. ( Toray Industries,Inc. (Japan) ) Mitamura,S. ( Dai Nippon Printing Co.,Ltd. (Japan) ) Okuno,D. ( Dai Nippon Printing Co.,Ltd. (Japan) ) Kurihara,M. ( Dai Nippon Printing Co.,Ltd. (Japan) ) Hayshi,N. ( Dai Nippon Printing Co.,Ltd. (Japan) ) - 掲載資料名:
- Photomask and X-Ray Mask Technology V
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3412
- 発行年:
- 1998
- 開始ページ:
- 237
- 終了ページ:
- 245
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428646 [0819428647]
- 言語:
- 英語
- 請求記号:
- P63600/3412
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Performance of a chemically amplified positive resist for next-generation photomask fabrication
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
国際会議録
Performance of positive-tone chemically amplified resists for next-generation photomask fabrication
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |