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Physical properties and evaluation of spectrometer-grade CdSe single crystals

著者名:
Chen,H. ( Fisk Univ. )
Hayes,M. ( Fisk Univ. )
Ma,X. ( Fisk Univ. )
Chen,Y.-F. ( Fisk Univ. )
Egarievwe,S.U. ( Fisk Univ. )
Ndap,J.-O. ( Fisk Univ. )
Chattopadhyay,K. ( Fisk Univ. )
Burger,A. ( Fisk Univ. )
Leist,J.R. ( Cleveland Crystals,Inc. )
さらに 4 件
掲載資料名:
Hard X-ray and gamma-ray detector physics and applications : 22-23 July 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3446
発行年:
1998
開始ページ:
17
終了ページ:
28
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819429018 [0819429015]
言語:
英語
請求記号:
P63600/3446
資料種別:
国際会議録

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