Analysis of scattering from fractally rough surfaces by using the T-matrix method

著者名:

• Wang,X. ( China Research Institute of Radiowave Propagation )
• Luo,X. ( China Research Institute of Radiowave Propagation )
• Zhang,Z. ( China Research Institute of Radiowave Propagation )
• Fu,J. ( Xi'an Jiaotong Univ.(China) )

掲載資料名:

Microwave remote sensing of the atmosphere and environment : 15-17 September 1998, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3503

発行年:

1998

開始ページ:

265

終了ページ:

275

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819429629 [0819429627]

言語:

英語

請求記号:

P63600/3503

資料種別:

国際会議録