Blank Cover Image

Concept of a Neural System for Real-Time Evaluation of Spectroscopic Measurements

著者名:
Redei,L. ( (Hungary) )
Fried,M. ( (Hungary) )
Lohner,T. ( (Hungary) )
Polgar,O. ( (Hungary) )
Barsony,I. ( (Hungary) )
Forizs,Sz. ( (Hungary) )
Horvath,Z.G. ( (Hungary) )
Humlicek,J. ( (Czech Republic) )
Wallinga,H. ( (The Netherlands) )
さらに 4 件
掲載資料名:
OPTIKA '98, 14-17 September 1998, Budapest, Hungary
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3573
発行年:
1998
開始ページ:
155
終了ページ:
159
出版情報:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430380 [0819430382]
言語:
英語
請求記号:
P63600/3573
資料種別:
国際会議録

類似資料:

1 国際会議録 PC-Controlled CCD-Matrix-based Optical Multichannel Analyzer for RESPECT Measurements

Forizs,Sz., Horrvath,Z.G., Lohner,T., Fried,M., Barsony,I.

SPIE-The International Society for Optical Engineering
7 国際会議録 Effect of SRS on pilot-tone-based monitoring technique in DWDM optical communication system

Gao, Z.G., Jin, J.G., Chen, M.H., Xie, S.Z.

SPIE-The International Society for Optical Engineering
2 国際会議録 RAPID THERMAL OXIDATION FOR PASSIVATION OF POROUS SILICON

Barsony, I., Klappe, J. G. E., Vazsonyi, E., Lohner, T., Fried, M.

MRS - Materials Research Society
8 国際会議録 Real-time video delivery system based on MPEG-4 CODEC

Xu, L., Sun, Z.G., Chen, Q.

SPIE-The International Society for Optical Engineering
3 国際会議録 LIGHT EMISSION VERSUS EXCITATION FROM POROUS STRUCTURES IN ION-IMPLANTED SILICON

Vazsonyi, E., Barsony, I., Lohner, T., Fried, M., Erostyak, J., Racz, M., Paszti, F.

MRS - Materials Research Society
9 国際会議録 Simple model for optimization design of high-performance In1-x-yGa yAI xAs strained MQW DFB lasers

Zhang, Y.J., Zhu, L., Gao, Z.G., Chen, M.H., Dong, Y., Xie, S.Z.

SPIE-The International Society for Optical Engineering
4 国際会議録 ANALYSIS OF HIGH-DOSE IMPLANTED SILICON BY HIGH-DEPTH RESOLUTION RBS AND SPECTROSCOPIC ELLIPSOMETRY AND TEM

Lohner, T., Mezey, G., Fried, M., Ghita, L., Ghita, C., Mertens, A., Kerkow, H., Kotai, E., Paszti, F., Banyai, F., …

Materials Research Society
10 国際会議録 Wide-spectral-range, Expanded-beam Spectroscopic Ellipsometer and its Application for Imaging/Mapping of Graded Nanocrystalline Si:H Films

A. Nemeth, D. Attygalle, L.R. Dahal, P. Aryal, Z. Huang, C. Salupo, P. Petrik, G. Juhasz, C. Major, O. Polgar, M. Fried, …

Materials Research Society
5 国際会議録 18 Neural Networks in Measurement Systems (an engineering view)

Horvath, G.

IOS Press
11 国際会議録 Modular PC-Controlled Polarimetric Ellipsometer with Variable Angle of Incidence and Spectral Options

Mosoni,T., Petrik,P., Fried,M., Barsony,I.

SPIE-The International Society for Optical Engineering
6 国際会議録 Real-time ultrasonic weld evaluation system

Katragadda,G., Nair,S., Liu,H., Brown,L.M.

SPIE-The International Society for Optical Engineering
12 国際会議録 Real-Time Monitoring of Semiconductor Growth by Spectroscopic Ellipsometry

Johs, B., Hale, J., Herzinger, C., Doctor, D., Elliott, K., Olson, G., Chow, D., Roth, J., Ferguson, I., Pelczynski, M., …

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12