Dislocation defect states in deformed silicon

Dislocation defect states in deformed silicon

著者名:

Patel, J.R. ( Bell Laboratories )
Kimerling, L.C. ( Bell Laboratories )

掲載資料名:

Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposia proceedings

シリーズ巻号:

2

発行年:

1981

開始ページ:

273

終了ページ:

277

出版情報:

New York: North Holland

ISSN:

02729172

ISBN:

9780444005960 [044400596X]

言語:

英語

請求記号:

M23500/2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017841
シリーズID:	PA00000010
会議名:	Materials Research Society Annual Meeting ; Symposium on defects in semiconductors
回次:	1980
会議開催地:	Boston, MA, USA
会議開催年:	1980.11.16-1980.11.20

類似資料:

1 国際会議録 Defect characterization by junction spectroscopy Kimerling, L.C. North Holland	7 国際会議録 INFLUENCE OF OXYGEN AND BORON ON DEFECT PRODUCTION IN IRRADIATED SILICON Drevinsky, P. J., Caefer, C. E., Tobin, S. P., Mikkelsen Jr., J. C., Kimerling, L. C. Materials Research Society
2 国際会議録 Silicon for photonics Kimerling,L.C. SPIE-The International Society for Optical Engineering	8 国際会議録 TRENDS IN THE BISTABLE PROPERTIES OF IRON-ACCEPTOR PAIRS IN SILICON. CHANTRE,A., KIMERLING,L.C. Trans Tech Publications
3 国際会議録 NEW IMPURITY-DEFECT REACTIONS IN SILICON. CHANTRE,A., BENTON,J.L., ASOM,M.T., KIMERLING,L.C. Trans Tech Publications	9 国際会議録 Silicon surface defects:the roles of passivation and surface contamination Reddy,A.J., Burr,T.A., Chan,J.K., Norga,G.J., Michel,J., Kimerling,L.C. Trans Tech Publications
4 国際会議録 Interstitial Defect Reactions in Silicon Kimerling,L.C., Asom,M.T., Benton,J.L., Drevinski,P.J., Caefer,C.E. Trans Tech Publications	10 国際会議録 Erbium in Silicon:A Defect System for Optoelectronic Integrated Circuits Michel,J., Palm,J., Gan,F., Ren,F.Y.G., Zheng,B., Dunham,S.T., Kimerling,L.C. Trans Tech Publications
5 国際会議録 Defect Engineering for Silicon Microphotonics Agarwal, A., Foresi, J.S., Giovane, L.M., Liao, L., Michel, J., Wada, K., Kimerling, L.C. Electrochemical Society	11 国際会議録 IDENTIFICATION OF INTERSTITIAL CARBON RELATED DEFECTS IN SILICON Benton, J. L., Asom, M. T., Sauer, R., Kimerling, L. C. Materials Research Society
6 国際会議録 Defects and Future Silicon Technology Palm, J., Kimerling, L. C. MRS - Materials Research Society	12 国際会議録 Nonradiative energy back transfer from erbium in silicon by impurity Auger process Palm,J., Gan,F., Kimerling,L.C. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12