Blank Cover Image

A review of NTD-induced defects in silicon

著者名:
Meese, J.M. ( University of Missouri Research Reactor )  
掲載資料名:
Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposia proceedings
シリーズ巻号:
2
発行年:
1981
開始ページ:
225
終了ページ:
240
出版情報:
New York: North Holland
ISSN:
02729172
ISBN:
9780444005960 [044400596X]
言語:
英語
請求記号:
M23500/2
資料種別:
国際会議録

類似資料:

1 国際会議録 Reduction of alfa-particle sensitivity in dynamic semiconductor memories (16K d-RAMs) by neutron irradiation

Thompson, Charles E., Meese, J.M.

North Holland
7 国際会議録 DEFECT REDUCTION AND DEFECT ENGINEERING IN SILICON-ON-SAPPHIRE MATERIAL USING Ge IMPLANTATION

Namavar, F., Cortesi, E., Kalkhoran, N.M., Manke, J.M., Buchanan, B.L.

Materials Research Society
2 国際会議録 The Saw-Damage-Induced Structural Defects on the Surface of Silicon Crystals

Kim, J.M., Kim, Y.K.

Electrochemical Society
8 国際会議録 STRUCTURAL DEFECTS IN LASER ANNEALED ARSENIC IMPLANTED SILICON

Tonnerre, J.M., Matsuura, M., Cargill III, G.S., Hobbs, L.W.

Materials Research Society
3 国際会議録 Light Induced Defect Creation Kinetics in Thin Film Protocrystalline Silicon Materials and Their Solar Cells

Wronski, C.R., Pearce, J.M., Koval, R.J., Niu, X., Ferlauto, A.S., Koh, J., Collins, R.W.

Materials Research Society
9 国際会議録 Defects in NTD MCZ Si Doped with Magnesium

Tkacheva,T., Petrov,G., Shabalin,E., Golubev,V., Kropotov,G., Shek,E., Sobolev,N.

Trans Tech Publications
4 国際会議録 Aluminum related thermally induced defects in silicon

Meilwes,N, Niklas,JR, Spaeth,J-M

Trans Tech Publications
10 国際会議録 Annealing Study on Radiation-Induced Defects in 6H-SiC

Pinheiro, M.V.B., Lingner, T., Caudepon, F., Greulich-Weber, S., Spaeth, J.M.

Trans Tech Publications
5 国際会議録 Radiation Induced Defect in Silicon

Watts, S.J.

Electrochemical Society
11 国際会議録 Irradiation induced defects in silicon detectors

Watts, S.J.

Electrochemical Society
6 国際会議録 Thermo-Mechanical Analysis of Directional Crystallisation of Multi-Crystalline Silicon Ingots

M'Hamdi, M., Meese, E.A., Laux, H., Ovrelid, E.J.

Trans Tech Publications
12 国際会議録 Noble Gas Induced Defects in Silicon

Weber, J., Estreicher, S. K.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12