Fluorescence Anisotropy Measurements on Polymer Materials as a Function of Applied Shear and Extensional Stress
- 著者名:
- Bur, A. J. ( National Institute of Standards and Technology )
- Lowry, R. E.
- Thomas, C. L.
- Roth, S. C.
- Wang, F. W.
- 掲載資料名:
- Back to the future : conference proceedings : ANTEC 1992, Detroit, May 3-7
- シリーズ名:
- Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
- シリーズ巻号:
- 38
- 発行年:
- 1992
- パート:
- 2
- 開始ページ:
- 2088
- 終了ページ:
- 2090
- 総ページ数:
- 3
- 出版情報:
- Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
- 言語:
- 英語
- 請求記号:
- S42700/921583
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Observations of Shear Stress and Molecular Orientation Using Fluorescence Anisotropy Measurements
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Society of Plastics Engineers, Inc. (SPE) |
Society of Plastics Engineers, Inc. (SPE) |
Society of Plastics Engineers, Inc. (SPE) |
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Society of Plastics Engineers, Inc. (SPE) |
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6
国際会議録
Fluorescence Based Temperature Measurements and Applications to Real-Time Polymer Processing
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American Chemical Society |