Blank Cover Image

Defect Preventive Quality Control in Manufacturing

著者名:
掲載資料名:
Concurrent engineering : tools and technologies for mechanical system design
シリーズ名:
NATO ASI series. Series F, Computer and systems sciences
シリーズ巻号:
108
発行年:
1993
開始ページ:
405
終了ページ:
431
総ページ数:
27
出版情報:
Berlin: Springer-Verlag
ISSN:
02581248
ISBN:
9783540565321 [3540565329]
言語:
英語
請求記号:
N11483/108
資料種別:
国際会議録

類似資料:

S. Minezawa, Y. Ishibashi, K. E. Psannis

Society of Photo-optical Instrumentation Engineers

Hassan, M., Khairy, A.B., Fayommi, S.M., Abou-Ali, M.

Society of Plastics Engineers

Gonzalez D. A., Madruga F. J., Ibarra-Castanedo C., Conde O., Lopez-Higuera J. M.

SPIE - The International Society of Optical Engineering

E. Berkman, R.T. Leonard, M.J. Paisley, Y. Khlebnikov, M.J. O'Loughlin

Trans Tech Publications

Wu, Q., Halle, S., Bukofsky, S.J., Butt, S.A., Hibbs, M.S.

SPIE-The International Society for Optical Engineering

9 国際会議録 Defect control in As-rich GaAs

Specht,P., Jeong,S., Sohn,H., Luysberg,M., Prasad,A., Gebauer,J., Krausse-Rehberg,R., Weber,E.R.

Trans Tech Publications

Fujiki, H., Suganuma, M., Takagi, K., Nishiwaki, S., Yoshizawa, S., Okabe, S., Yatsunami, J., Frenkel, K., Troll, W., …

American Chemical Society

Lee, D., Chu, B., Fang, T. Y., Shieh, W. B., Hu, S., Chen, J. -H., Morgan, R.

SPIE - The International Society of Optical Engineering

Minezawa, S., Ishibashi, Y.

SPIE - The International Society of Optical Engineering

Huヲツmann,S., Kleuver,W., GUnther,B., Grdneweller,J., Rath,H.

SPIE - The International Society for Optical Engineering

Hu, S.M.

Electrochemical Society

Wu M. G.

Society of Plastics Engineers, Inc. (SPE)

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12