Surface Modifications Via Photo-Chemistry in a Reflection Scanning Near-Field Optical Microscope
- 著者名:
- 掲載資料名:
- Optics at the nanometer scale : imaging and storing with photonic near fields
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 319
- 発行年:
- 1996
- 開始ページ:
- 263
- 終了ページ:
- 275
- 総ページ数:
- 13
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792340201 [0792340205]
- 言語:
- 英語
- 請求記号:
- N11482/319
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
5
国際会議録
Imaging with Reflection Near-Field Optical Microscope in Light of Evanescent Dipole Radiation,
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |