Blank Cover Image

Optical inspection of large-scale technical components

著者名:
掲載資料名:
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3824
発行年:
1999
開始ページ:
210
終了ページ:
216
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433107 [0819433101]
言語:
英語
請求記号:
P63600/3824
資料種別:
国際会議録

類似資料:

1 国際会議録 Some ways to improve the recognition of imperfections in large-scale components using shearography

Osten,W., Kalms,M.K., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering
7 国際会議録 Advanced shearographic system for nondestructive testing of industrial and artwork components

Kalms, M.K., Osten, W., Jueptner, W.P.

SPIE-The International Society for Optical Engineering
2 国際会議録 Shearography system for the testing of large-scale aircraft components taking into account noncooperative surfaces

Osten,W., Kalms,M.K., Juptner,W.P.O., Tober,G., Bisle,W., Scherling,D.

SPIE - The International Society for Optical Engineering
8 国際会議録 Active industrial surface inpection with the inverse projected-fringe techinique

Kalms, M.K., Osten, W., Jueptner, W.P.

SPIE-The International Society for Optical Engineering
3 国際会議録 Inverse projected fringe technique

Kalms,M.K., Osten,W., Juptner,W.P.

SPIE-The International Society for Optical Engineering
9 国際会議録 New light sources and sensors for active optical 3D inspection

Osten,W., Juptner,W.P.

SPIE - The International Society for Optical Engineering
4 国際会議録 Automatic adaption of projected fringe patterns using a programmable LCD projector

Kalms,M.K., Juptner,W.P., Osten,W.

SPIE-The International Society for Optical Engineering
10 国際会議録 General appriach for the description of optical 3D measuring systems

Andra,P., Juptner,W.P., Kebbel,V., Osten,W.

SPIE-The International Society for Optical Engineering
5 国際会議録 NDT on wide-scale aircraft structures with digital speckle shearography

Kalms,M.K., Osten,W., Juptner,W.P., Bisle,W., Scherling,D., Tober,G.

SPIE - The International Society for Optical Engineering
11 国際会議録 High-resolution measurement of extended technical surfaces with scalable topometry

Osten,W., Kayser,D., Bothe,T., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering
6 国際会議録 Progress with the implementation of a shearography system for the testing of technical components

Osten, W., Baumbach, T., Falldorf, C., Kalms, M.K., Jueptner, W.P.

SPIE-The International Society for Optical Engineering
12 国際会議録 Laser-based systems for the structural diagnoistic of arwork: an application to XVII-century Byzantine icons

Tornari,V., Bonarou,A., Castellini,P., Esposito,E., Osten,W., Kalms,M.K., Smyrnakis,N., Stasinopulos,S.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12