Blank Cover Image

Measurement of depth profile of hydrogen isotope atom contained in solid material using resonant laser ablation

著者名:
掲載資料名:
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3824
発行年:
1999
開始ページ:
149
終了ページ:
154
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433107 [0819433101]
言語:
英語
請求記号:
P63600/3824
資料種別:
国際会議録

類似資料:

1 国際会議録 Detection of hydrogen isotope atoms by mass spectrometry combined with resonant ionization

Okada,Y., Yorozu,M., Endo,A.

SPIE - The International Society for Optical Engineering
7 国際会議録 Lithographic fabrication of microstructures by laser ablation using femtosecond laser

Nakata, Y., Okada, T., Maeda, M.

SPIE - The International Society of Optical Engineering
2 国際会議録 Temperature measurement by laser-induced fluorescence of nitric oxide in combustion flame

Yorozu,M., Okada,Y., Endo,A.

SPIE-The International Society for Optical Engineering
8 国際会議録 Development of a picosecond Nd:YLF amplifier for laser-Compton x-ray generator

Okada,Y., Yorozu,M., Yang,J., Kobayashi,K., Sakai,F., Aoki,Y., Endo,A.

SPIE-The International Society for Optical Engineering
3 国際会議録 Development of a compact lidar system using OPO

Okada,Y., Yorozu,M., Endo,A.

SPIE-The International Society for Optical Engineering
9 国際会議録 Fluctuation of femtosecond x-ray pulses generated by a laser-Compton scheme

Endo, A., Yorozu, M., Yang, J., Sakai, F.

SPIE-The International Society for Optical Engineering
4 国際会議録 Characterization of the monochromatic laser Compton x-ray beam with picosecond and femtosecond pulse widths

Endo,A., Takasago,K., Ito,S., Yang,J., Yanagida,T., Okada,Y., Yorozu,M., Sakai,F.

SPIE-The International Society for Optical Engineering
10 国際会議録 Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling

Unlu, K., Wehring, B.W., Hossain, T.Z., Lowell, J.K.

Electrochemical Society
5 国際会議録 Transcriptional ablation using femtosecond laser with mask

Nakata, Y., Okada, T., Maeda, M.

SPIE - The International Society of Optical Engineering
11 国際会議録 Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling

Unlu,K., Wehring,B.W., Hossain,T.Z., Lowell,J.K.

SPIE-The International Society for Optical Engineering
6 国際会議録 Laser synchrotron femtosecond x-ray source for novel imaging

Endo,A., Kobayashi,K., Takasago,K., Ito,S., Yang,J., Okada,Y., Yorozu,M., Sakai,F., Aoki,Y.

SPIE-The International Society for Optical Engineering
12 国際会議録 Laser-Aided Imaging Diagnostics of Laser-Ablation Plume

Okada, T.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12