X-ray microtomography for fracture studies in cement-based materials

X-ray microtomography for fracture studies in cement-based materials

著者名:

Landis,E.N. ( Univ.of Maine )
Keane,D.T.

掲載資料名:

Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3772

発行年:

1999

開始ページ:

105

終了ページ:

113

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432582 [081943258X]

言語:

英語

請求記号:

P63600/3772

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017623
シリーズID:	PA00000029
会議名:	Optics & Photonics : Developments in X-Ray Tomography
回次:	1999 : 2nd
会議開催地:	Denver, CO, USA
会議開催年:	1999.07.22-1999.07.23

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