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Geoscience applications of x-ray computed microtomography

著者名:
掲載資料名:
Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3772
発行年:
1999
開始ページ:
78
終了ページ:
86
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432582 [081943258X]
言語:
英語
請求記号:
P63600/3772
資料種別:
国際会議録

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