Referenced polarization imaging for surface displacement measurements

Referenced polarization imaging for surface displacement measurements

著者名:

Ulibarri,L.J. ( The Boeing Co. )
Boger,J.K.
Fetrow,M.P.

掲載資料名:

Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3740

発行年:

1999

開始ページ:

44

終了ページ:

47

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432148 [0819432148]

言語:

英語

請求記号:

P63600/3740

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017620
シリーズID:	PA00000029
会議名:	Optical Engineering for Sensing and Nanotechnology : ICOSN '99
回次:	1999
会議開催地:	Yokohama, Japan
会議開催年:	1999.06.16-1999.06.18

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