X-ray residual stress analysis of free-standing ceramics

X-ray residual stress analysis of free-standing ceramics

著者名:

Kraus,I. ( Czech Technical Univ./Prague )

掲載資料名:

International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3687

発行年:

1999

開始ページ:

379

終了ページ:

381

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431615 [0819431613]

言語:

英語

請求記号:

P63600/3687

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017615
シリーズID:	PA00000029
会議名:	International Workshop on New Approaches to High-Tech Materials-Nondestructive Testing and Computer Simulations in Materials Science and Engineering
回次:	1998 : 2nd
会議開催地:	St. Petersburg, Russia
会議開催年:	1998.06.08-1998.06.12

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