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Optical nanoprobes for SNOM based on laser technology

著者名:
Veiko,V.P. ( St.Petersburg Institute of Fine Mechanics and Optics )
Voznessenski,N.B.
Smirnov,I.B.
Kalachev,A.I.
Ivanitski,D.I.
Voronin,J.M.
Wolf,M.
Meteva,K.
さらに 3 件
掲載資料名:
Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3618
発行年:
1999
開始ページ:
9
終了ページ:
16
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430885 [0819430889]
言語:
英語
請求記号:
P63600/3618
資料種別:
国際会議録

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1 国際会議録 Optical nanoprobes for scanning near-field optical microscopy:functions,requirements,fabrication,and theoretical reconstruction from far-field investigation

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