Light emission from silicon nanometer-scale diode antifuses
- 著者名:
- 掲載資料名:
- Applications of photonic technology 3 : closing the gap between theory, development, and application
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3491
- 発行年:
- 1998
- 開始ページ:
- 209
- 終了ページ:
- 213
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819429506 [0819429503]
- 言語:
- 英語
- 請求記号:
- P63600/3491
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
Influence of Interface Recombination in Light Emission from Lateral Si-Based Light Emitting Devices
Electrochemical Society |
2
国際会議録
High Quality Silicon Oxide Deposited with A Multipolar Electron Cyclotron Resonance Plasma Source
Electrochemical Society |
Materials Research Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering | |
6
国際会議録
Influence of Interface Recombination in Light Emission from Lateral Si-Based Light Emitting Devices
Electrochemical Society |
Materials Research Society |