Blank Cover Image

Analysis of third-order spherical aberration with the continuous wavelet transform

著者名:
掲載資料名:
Wavelet Applications VII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4056
発行年:
2000
開始ページ:
507
終了ページ:
514
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436825 [0819436828]
言語:
英語
請求記号:
P63600/4056
資料種別:
国際会議録

類似資料:

Sheu,J.-Y., Chang,R.-S., Lin,C.-H.

SPIE - The International Society for Optical Engineering

Chung, S. -H., Kim, Y. -J., Chang, I. -C., Jeong, H. -S.

SPIE - The International Society of Optical Engineering

Chang,R.S., Sheu,J.-Y., Lin,C.-H.

SPIE-The International Society for Optical Engineering

Schaeben, H., Bemstein, S., Hielscher, R., Beckmann, J., Keiner, J., Prestin, J.

Trans Tech Publications

A. Miks, J. Novak, P. Novak

Society of Photo-optical Instrumentation Engineers

A. Z. Abid, M. A. Gdeisat, D. R. Burton, M. J. Lalor, H. S. Abdul-Rahman

Society of Photo-optical Instrumentation Engineers

Chang,R.-S., Shen,J.-Y., Fan,P.-L.

SPIE - The International Society for Optical Engineering

C.-H. Chang, C. Chou, H.-F. Chang, H.-F. Yau, H.-J. Huang, W.-C. Kuo

SPIE - The International Society of Optical Engineering

Shiu, L.-H., Chen, C.-K., Gau, T.-S., Lin, B.-J.

SPIE - The International Society of Optical Engineering

W.-H. Lin, C.-H. Chen, J.-S. Lee

Society of Photo-optical Instrumentation Engineers

Kirk,J.P., Schank,S., Lin,C.Y.

SPIE-The International Society for Optical Engineering

Tung, C., Chiu, T.-K., Lo, W., Wang, P.-H., Lin, S.-J., Jee, S.-H., Dong, C.-Y.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12