Analysis of primary aberration with the two-dimension discrete wavelet transform

Analysis of primary aberration with the two-dimension discrete wavelet transform

著者名:

Sheu,J.-Y. ( Kwang Wu Institute of Technology and Commerce )
Chang,R.-S.
Lin,C.-H.

掲載資料名:

Wavelet Applications VII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4056

発行年:

2000

開始ページ:

372

終了ページ:

380

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436825 [0819436828]

言語:

英語

請求記号:

P63600/4056

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017593
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Wavelet Applications
回次:	2000 : 7th
会議開催地:	Orlando, FL, USA
会議開催年:	2000.04.26-2000.04.28

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