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*Optical and microstructural characterization of nanocrystalline silicon superlattices

著者名:
Tsybeskov, L.
Grom, G. F.
Krishnan, R.
Fauchet, P. M.
McCaffrey, J. P.
Baribeau, J-M.
Sproule, G. I.
Lockwood, D. J.
Timoshenko, V.
Diener, J.
Heckler, H.
Kovalev, D.
Koch, F.
Blanton, T. N.
さらに 9 件
掲載資料名:
Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
588
発行年:
2000
開始ページ:
173
出版情報:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994966 [1558994963]
言語:
英語
請求記号:
M23500/588
資料種別:
国際会議録

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