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OPTICAL CHARACTERIZATION OF InGaAs/InP QUANTUM WIRES AND DOTS

著者名:
Gu, S. Q.
Reuter, E.
Xu, Q.
Chang, H.
Panepucci, R.
Adesida, I.
Bishop, S. G.
Caneau, C.
Bhat, R.
さらに 4 件
掲載資料名:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
324
発行年:
1994
開始ページ:
181
出版情報:
Pittsburgh: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992238 [1558992235]
言語:
英語
請求記号:
M23500/324
資料種別:
国際会議録

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