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PROCESS MONITORING FOR FABRICATION OF MERCURIC IODIDE ROOM TEMPERATURE RADIATION DETECTORS

著者名:
Scyoc, J. M. Van
Schlesinger, T. E.
Yao, H.
James, R. B.
Natarajan, M.
Bao, X. J.
Iwanczyk, J. S.
Patt, B. E.
Berg, L. van den
さらに 4 件
掲載資料名:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
324
発行年:
1994
開始ページ:
65
出版情報:
Pittsburgh: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992238 [1558992235]
言語:
英語
請求記号:
M23500/324
資料種別:
国際会議録

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1 国際会議録 Defects and Impurities in Mercuric Iodide Processing

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3 国際会議録 INVESTIGATION OF DEEP LEVEL DEFECTS IN MERCURIC IODIDE BY THERMALLY STIMULATED CURRENT SPECTROSCOPY

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4 国際会議録 EFFECTS OF CONTACT MATERIALS ON THE THERMALLY STIMULATED CURRENT SPECTRA OF MERCURIC IODIDE

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