Degradation and Recovery of Si1-xGex Devices by Irradiation | 東京工業大学附属図書館文献データベース

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Degradation and Recovery of Si1-xGex Devices by Irradiation

著者名:

Vanhellemont, J.

さらに 6 件

掲載資料名:

Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

379

発行年:

1995

開始ページ:

365

出版情報:

Pittsburgh, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992825 [1558992820]

言語:

英語

請求記号:

M23500/379

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017534
シリーズID:	PA00000011
会議名:	Symposium on strained layer epitaxy-materials, processing, and device applications
回次:	1995
会議開催地:	San Francisco, CA, USA
会議開催年:	1995.04.17-1995.04.19

類似資料:

1 国際会議録 Irradiation Induced Lattice Defects in Si1-xGex Epitaxial Devices Ohyama,H., Vanhellemont,J., Takami,Y., Hayama,K., Kudo,T., Hakata,T., Kobayashi,K., Sunaga,H., Poortmans,J., Caymax,M. Trans Tech Publications	7 国際会議録 DEGRADATION AND RECOVERY OF BORON DOPED STRAINED SILICON GERMANIUM LAYERS AFTER 1-MeV ELECTRON IRRADIATION Ohyama, H., Vanhellemont, J., Trauwaert, M.-A., Poortmans, J., Caymax, M., Clauws, P. Materials Research Society
2 国際会議録 Lattiee defects in Si1-xGex epitaxial diodes induced by 20-MeV alpha rays Ohyama,H., Vanhellemont,J., Simoen,E., Claeys,C., Takami,Y., Hayama,K., Sunaga,H., Poortmans,J., Caymax,M. Trans Tech Publications	8 国際会議録 Degradation and Recovery of Si Diodes by 20-MeV Protons and 220-MeV Carbon Particles Hakata, T., Ohyama, H., Simoen, E., Claeys, C., Sunaga, H., Kobayashi, K., Hososhima, M. MRS - Materials Research Society
3 国際会議録 Impact of the Ge Content on the Radiation Hardness of Heterojunction Diodes in SiGe Strained Layers Ohyama, H., Simoen, E., Claeys, C., Takami, Y., Hayama, K., Hakata, T., Tokuyama, J., Kobayashi, K., Sunaga, H., … MRS - Materials Research Society	9 国際会議録 Irradiation induced lattice defects in In0.53Ga0.47As PIN photodiodes Kudou,T., Ohyama,H., Vanhellemont,J., Simoen,E., Claeys,C., Takami,Y., Fujii,A., Sunaga,H. Trans Tech Publications
4 国際会議録 Proton irradiation induced lattice defects in Si diodes and their effects on device performance Ohyama, H., Simoen, E., Claeys, C., Vanhellemont, J., Takami, Y., Hayama, T., Sunaga, H., Kobayashi, K. Electrochemical Society	10 国際会議録 ION IMPLANTATION OF HIGH DOSES OF Co IN Si1-xGex ALLOYS Lauwers, A., Maex, K., Vandervorst, W., Brijs, G., Poortmans, J., Caymax, M., Vanhellemont, J., Petersson, S. Materials Research Society
5 国際会議録 Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX Ohyama, H., Simoen, E., Claeys, C., Takami, Y., Kawamura, K., Hakata, T., Sunaga, H., Ogita, Y. Electrochemical Society	11 国際会議録 Radiation Source Dependence of Degradation in MOSFETS on SIMOX Substrate Hakata, T., Ohyama, H., Simoen, E., Claeys, C., Takami, Y., Kawamura, K., Miyahara, K., Hososhima, M. MRS - Materials Research Society
6 国際会議録 Radiation Damage in Si Avalanche Photodiodes by 1-MeV Fast Neutrons and 220-MeV Carbon Particles Ohyama, H., Hakata, T., Simoen, E., Claeys, C., Takami, Y., Hayama, K., Tokuyama, J., Shigaki, K., Kobayashi, K., … MRS - Materials Research Society	12 国際会議録 Influence Of Mechanical Stress On The Electrical Performance Of Polycrystalline-Silicon Resistors Claeys, C., Ikegami, M., Kobayashi, K., Nakabayashi, M., Ohyama, H., Simoen, E., Sunaga, H., Takami, Y., Takizawa, H., … Materials Research Society

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