Degradation and Recovery of Si1-xGex Devices by Irradiation
- 著者名:
Ohyama, H. Vanhellemont, J. Takami, Y. Hayama, K. Kudo, T. Hakata, T. Kobayashi, K. Sunaga, H. Hironaka, I. Poortmans, J. Caymax, M. - 掲載資料名:
- Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 379
- 発行年:
- 1995
- 開始ページ:
- 365
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992825 [1558992820]
- 言語:
- 英語
- 請求記号:
- M23500/379
- 資料種別:
- 国際会議録
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