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Variation of GaN Valence Bands with Biaxial Stress: Quantification of Residual Stress and Impact on Fundamental Band Parameters

著者名:
Edwards, N. V.
Yoo, S. D.
Bremser, M. D.
Horton, M. N.
Perkins, N. R.
Weeks, T. W., Jr.
Liu, H.
Stall, R. A.
Kuech, T. F.
Davis, R. F.
Aspnes, D. E.
さらに 6 件
掲載資料名:
III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
449
発行年:
1997
開始ページ:
781
出版情報:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993532 [1558993533]
言語:
英語
請求記号:
M23500/449
資料種別:
国際会議録

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