Wavefront sensors for control and process monitoring in optics manufacture

Wavefront sensors for control and process monitoring in optics manufacture

著者名:

Neal,D.R. ( WaveFront Sciences,Inc. )
Armstrong,D.J.
Turner,W.T.

掲載資料名:

Lasers as tools for manufacturing II : 12-14 February 1997, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2993

発行年:

1997

開始ページ:

211

終了ページ:

220

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424044 [0819424048]

言語:

英語

請求記号:

P63600/2993

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017506
シリーズID:	PA00000029
会議名:	Photonics West : Lasers as Tools for Manufacturing
回次:	1997 : 2nd
会議開催地:	San Jose, CA, USA
会議開催年:	1997.02.12-1997.02.14

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1 国際会議録 Specialized wavefront sensors for adaptive optics D.R. Neal, J.D. Mansell, J.K. Gruetzner, R. Morgan, M.E. Warren Society of Photo-optical Instrumentation Engineers	7 国際会議録 Performance of wavefront sensors in strong scintillation Barchers, J.D., Fried, D.L., Link, D.J., Tyler, G.A., Moretti, W., Brennan, T.J., Fugate, R.Q. SPIE-The International Society for Optical Engineering
2 国際会議録 Wavefront sensor testing in hypersonic flows using a laser-spark guide star Neal,D.R., Armstrong,D.J., Hedlund,E., Lederer,M., Collier,A.S., Spring,C., Gruetzner,J.K., Hebner,G.A., Mansell,J.D. SPIE-The International Society for Optical Engineering	8 国際会議録 Measurement of aberrations in microlenses using a Shack-Hartmann wavefront sensor Pulaski, P.D., Roller, J.P., Neal, D.R., Ratte, K. SPIE-The International Society for Optical Engineering
3 国際会議録 Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor Neal, D.R., Pulaski, P., Raymond, T.D., Neal, D.A., Wang, Q., Griesmann, U. SPIE - The International Society of Optical Engineering	9 国際会議録 One-dimensional wavefront sensor development for tomographic flow measurements D.R. Neal, R.E. Pierson, E. Chen, K.P. Bishop, L.J. McMackin Society of Photo-optical Instrumentation Engineers
4 国際会議録 Shack-Hartmann wavefront sensor precision and accuracy Neal, D.R., Copland, J., Neal, D.A. SPIE-The International Society for Optical Engineering	10 国際会議録 Improving Quality of Electroplated Printed Circuit Boards through Process Control Turner, D.R. Electrochemical Society
5 国際会議録 Amplitude and phase beam characterization using a two-dimensional wavefront sensor Neal,D.R., Alford,W.J., Gruetzner,J.K., Warren,M.E. SPIE-The International Society for Optical Engineering	11 国際会議録 Characterization of infrared laser systems Neal, Daniel R., Armstrong, Darrell J., Turner, W. Tim SPIE
6 国際会議録 Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensor Brown,M.K., Gong,T.J., Neal,D.R., Roller,J.P., Luanava,S., Urey,H. SPIE-The International Society for Optical Engineering	12 国際会議録 Fizeau interferometry testbed: wavefront control Lyon, R. G., Carpenter, K. G., Mazzuca, L., Huet, H., Cottle, P. W., Petrone, P. P. III, Dagoda, P., Liiva, P., Marzouk, … SPIE - The International Society of Optical Engineering

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