Compensation method of antiferroelectric liquid crystal device characteristic variation caused by temperature changing

Compensation method of antiferroelectric liquid crystal device characteristic variation caused by temperature changing

著者名:

Zhao,W. ( Changchun Institute of Physics )
Sun,R.
Guo,J.
Huang,X.

掲載資料名:

Display devices and systems : 6-7 November 1996, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2892

発行年:

1996

開始ページ:

172

終了ページ:

177

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422934 [0819422932]

言語:

英語

請求記号:

P63600/2892

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017496
シリーズID:	PA00000029
会議名:	Photonics China : Display devices and systems
回次:	1996
会議開催地:	Beijing, China
会議開催年:	1996.11.06-1996.11.07

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