Determination of the Chemicall Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge
- 著者名:
- 掲載資料名:
- Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 126-128
- 発行年:
- 1993
- 開始ページ:
- 575
- 終了ページ:
- 578
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496600 [0878496602]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
MRS - Materials Research Society |
American Chemical Society |
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Materials Research Society |
MRS - Materials Research Society |
12
国際会議録
X-RAY DETERMINATION OF SITE OCCUPATION PARAMETERS IN ORDERED TERNARIES Cu(AuxM1-x)M = Ni,Pd
Materials Research Society |