Surface inspection of web materials using the self-organizing map

Surface inspection of web materials using the self-organizing map

著者名:

Iivarinen, Jukka ( Helsinki University of Technology )
Rauhamaa, Juhani ( ABB Industry Oy )

掲載資料名:

Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3522

発行年:

1998

開始ページ:

96

終了ページ:

103

出版情報:

Bellingham, Wash., USA: SPIE

ISSN:

0277786X

ISBN:

9780819429834 [081942983X]

言語:

英語

請求記号:

P63600/3522

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017414
シリーズID:	PA00000029
会議名:	Photonics East : Intelligent Robots and Computer Vision
回次:	1998 : 17th
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.02-1998.11.03
主題:	defect classification; defect detection; self-organizing map; surface inspection

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