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MTF measurement of LCDs by a linear CCD imager: I. Monochrome case

著者名:
  • Kim,T.H. ( Yeungnam Univ.(Korea) )
  • Choe,O.S. ( Yeungnam Univ.(Korea) )
  • Lee,Y.W. ( Korea Research Institute of Standards and Science )
  • Cho,H.M. ( Korea Research Institute of Standards and Science )
  • Lee,I.W. ( Korea Research Institute of Standards and Science )
掲載資料名:
Optical manufacturing and testing II : 27-29 July 1997, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3134
発行年:
1997
開始ページ:
526
終了ページ:
531
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425560 [0819425567]
言語:
英語
請求記号:
P63600/3134
資料種別:
国際会議録

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