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Production and characterization of x-ray speckle at Sector 8 of the advanced photon source

著者名:
Sandy,A.R. ( Massachusetts Institute of Technology )
Lurio,L.B. ( Massachusetts Institute of Technology )
Mochrie,S.G.J. ( Massachusetts Institute of Technology )
Malik,A. ( Argonne National Lab. )
Stephenson,G.B. ( Argonne National Lab. )
Sutton,M. ( McGill Univ.(Canada) )
さらに 1 件
掲載資料名:
Coherent electron-beam x-ray sources : techniques and applications : 31 July-1 August 1997, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3154
発行年:
1997
開始ページ:
27
終了ページ:
38
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425768 [0819425761]
言語:
英語
請求記号:
P63600/3154
資料種別:
国際会議録

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