Production and characterization of x-ray speckle at Sector 8 of the advanced photon source
- 著者名:
Sandy,A.R. ( Massachusetts Institute of Technology ) Lurio,L.B. ( Massachusetts Institute of Technology ) Mochrie,S.G.J. ( Massachusetts Institute of Technology ) Malik,A. ( Argonne National Lab. ) Stephenson,G.B. ( Argonne National Lab. ) Sutton,M. ( McGill Univ.(Canada) ) - 掲載資料名:
- Coherent electron-beam x-ray sources : techniques and applications : 31 July-1 August 1997, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3154
- 発行年:
- 1997
- 開始ページ:
- 27
- 終了ページ:
- 38
- 出版情報:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819425768 [0819425761]
- 言語:
- 英語
- 請求記号:
- P63600/3154
- 資料種別:
- 国際会議録
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