Blank Cover Image

Texture analysis for wooden plate classification

著者名:
掲載資料名:
Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3164
発行年:
1997
開始ページ:
9
終了ページ:
15
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425867 [0819425869]
言語:
英語
請求記号:
P63600/3164
資料種別:
国際会議録

類似資料:

1 国際会議録 Preparation of alkylglucosides using Al-MCM-41 molecular sieves as catalysts

Andrade, H. M. C., Gonzaga, A. R. E., Aguiar, L. G.

Elsevier
7 国際会議録 Quality classification of wooden surfaces using Gabor filters and genetic feature optimization

Polzleitner,W., Schwingskakl,G.

SPIE - The International Society for Optical Engineering
2 国際会議録 Wood texture classification by fuzzy neural networks

Gonzaga,A., Franca,C.A., Slaets,A.F.F.

SPIE - The International Society for Optical Engineering
8 国際会議録 Range image binarization: applications to wooden stamp analysis

Seulin, R., Morel, O., Millon, G., Nicolier, F.

SPIE-The International Society for Optical Engineering
3 国際会議録 ARGUS: a flexible real-time system for 2D defect and texture classification of wooden materials

W. Pöelzleitner, G. Schwingskakl, G. Paar

Society of Photo-optical Instrumentation Engineers
9 国際会議録 Texture Analysis of Aluminum Plate Produced by ECAP

Baeck, S.M., Seok, H.-K., Lee, J.-C., Kim, D.-I., Lee, H.-C., Oh, K.H.

Trans Tech Publications
4 国際会議録 Real-time color-based texture analysis for sophisticated defect detection on wooden surfaces (Invited Paper)

Polzleitner, W., Schwingshakl, G.

SPIE - The International Society of Optical Engineering
10 国際会議録 Real-time analysis of the grain on wooden planks

Kellner, M. A., Hanning, T., Farr, H.

SPIE-The International Society for Optical Engineering
5 国際会議録 Classification of wooden plates by visual inspection based in the characteristics of entropic threshold method

Rodrigues, Evandro Luis Linhari, Roda, Valentin Obac

SPIE
11 国際会議録 Use of an X-ray imaging plate for texture measurements

Brokmeier,H.-G., Ermrich,M.

Trans Tech Publications
6 国際会議録 Gabor wavelet image analysis for soil texture classification

Sun, Y., Long, Z., Jang, P. -R., Plodinec, M. J.

SPIE - The International Society of Optical Engineering
12 国際会議録 Sensitivity analysis for texture models applied to rust steel classification

Trujillo, M., Sadki, M.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12