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Determination of diffusion lengths of minority carriers in Hg1-xCdxTe (x｡ﾁ0.2 to 0.3) by EBIC method

著者名:
Franc,J. ( Charles Univ.(Czech Requblic) )
Belas,E. ( Charles Univ.(Czech Requblic) )
Grill,R. ( Charles Univ.(Czech Requblic) )
Toth,A. ( Research Institute for Technical Physics (Hungary) )
Sitter,H. ( Johannes Kepler Univ.(Austria) )
Moravec,P. ( Charles Univ.(Czech Requblic) )
Hoschl,P. ( Charles Univ.(Czech Requblic) )
さらに 2 件
掲載資料名:
Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3182
発行年:
1997
開始ページ:
207
終了ページ:
215
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426093 [0819426091]
言語:
英語
請求記号:
P63600/3182
資料種別:
国際会議録

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