Blank Cover Image

Mixing of 28-THz CO2-laser radiation by nanometer thin film Ni-NiO-Ni diodes with difference frequencies up to 176 GHz

著者名:
Fumeaux,C. ( Swiss Federal Institute of Technology )
Kneubuhl,F.K. ( Swiss Federal Institute of Technology )
Herrmann,W. ( Swiss Federal Institute of Technology )
Rothuizen,H. ( IBM Research Lab.(Switzerland) )
Lipphardt,B. ( Physikalisch-Technische Bundesanstalt (Germany) )
Weiss,C.O. ( Physikalisch-Technische Bundesanstalt (Germany) )
さらに 1 件
掲載資料名:
Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3379
発行年:
1998
開始ページ:
166
終了ページ:
172
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428288 [0819428280]
言語:
英語
請求記号:
P63600/3379
資料種別:
国際会議録

類似資料:

Fumeaux,C., Boreman,G.D., Herrmann,W., Rothuizen,H., Kneubuhl,F.K.

SPIE-The International Society for Optical Engineering

Y. Sun, Z. Tian, S. Fu, J. Wang, Y. Zhang

Society of Photo-optical Instrumentation Engineers

Matsuura,S., Chen,P., Blake,G.A., Pearson,J.C., Pickett,H.M.

SPIE - The International Society for Optical Engineering

Cahoon, E. C., Comrie, C. M., Pretorius, R.

North-Holland

Richter, D.A., Fried, A., Tittel, F.K.

SPIE-The International Society for Optical Engineering

Tittel,F.K., Lancaster,D.G., Richter,D., Goldberg,L., Koplow,J.P.

SPIE - The International Society for Optical Engineering

Lee,M., Li,C.-T., Deaver,B.S.,Jr., Weikle,R.M., Rao,R.A., Eom,C.B.

SPIE - The International Society for Optical Engineering

Messner,C., Sailer,M., Kostner,H., Hopfel,R.A.(deceased)

SPIE-The International Society for Optical Engineering

Beairsto,C., Penny,R., Squires,S., Ionin,A.A., Kotkov,A., Seleznev,L., Walter,R.

SPIE-The International Society for Optical Engineering

Cross, Graham L.W., Despont, Michel, Drechsler, Ute, Durig, Urs T., Rothuizen, Hugo, Binnig, Gerd K., Vettiger, Peter, …

Materials Research Society

Madurga, V., Vergara, J., Favieres, C.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12