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New method for identification of impurity levels in photorefractive crystals

著者名:
  • Song,H. ( Institute of Physics and Ctr. for Condensed Matter Physics (China) )
  • Chi,M. ( Institute of Physics and Ctr. for Condensed Matter Physics (China) )
  • Dou,S. ( Institute of Physics and Ctr. for Condensed Matter Physics (China) )
  • Zhu,Y. ( Institute of Physics and Ctr. for Condensed Matter Physics (China) )
  • Ye,P. ( Institute of Physics and Ctr. for Condensed Matter Physics (China) )
掲載資料名:
Photorefractive materials : phenomena and related applications, 16-17 September 1998 Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3554
発行年:
1998
開始ページ:
232
終了ページ:
235
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430151 [0819430153]
言語:
英語
請求記号:
P63600/3554
資料種別:
国際会議録

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