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Using CMM Data to Quantify Sink Marks

著者名:
掲載資料名:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida
シリーズ名:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号:
46
発行年:
2000
パート:
3
開始ページ:
2572
終了ページ:
2576
総ページ数:
5
出版情報:
Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
ISBN:
9781566768559 [1566768551]
言語:
英語
請求記号:
S42700/46
資料種別:
国際会議録

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